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Showing 1 to 1 of 1 for “"Uranium dioxide thin films"”.
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Radiation-enhanced diffusion of oxygen-18 in uranium dioxide thin films
… diffusion of a buried 18O tracer layer in thin film UO2 was measured using Secondary-Ion Mass Spectroscopy (SIMS). Thin films were grown using a dedicated magnetron sputtering chamber. Samples were irradiated with 1.8 MeV Kr+ over a temperature range from 295 K to 623 K. Measurements have …