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Showing 1 to 1 of 1 for “"Ultra-high vacuum (UHV) instrumentation"”.

  1. Study of semiconductor and metal surfaces using a novel scanning Kelvin probe.

    Petermann, Uwe2000

    … Scanning Kelvin probe (SKP) compatible with the Ultra-High-Vacuum (UHV) environment - the first automatic, high resolution, UHV-SKP in the UK. The Kelvin Probe is a capacitor device used to measure the work function phi between a vibrating reference electrode (the tip) and the surface under …

    rgu Repository record