Global ETD Search

Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.

Results

Showing 1 to 1 of 1 for “"Two degrees of freedom control (2 DOF)"”.

  1. Control-systems based analysis and design methods for scanning probe microscopy

    Recent demonstrations of nanoscience provide ample evidence indicating the feasibility of rational control, manipulation and interrogation of matter at the atomic scale. A class of devices, with micro-sized sensor probes, called Scanning Probe Microscopes (SPMs) are in the forefront of the …

    uiuc Repository record for Control-systems based analysis and design methods for scanning probe microscopy (opens in a new tab)