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Showing 1 to 1 of 1 for “"Transmission line pulsing (TLP)"”.

  1. Charged device model electrostatic discharge protection and test methods for integrated circuits

    Jack, NathanUniversity of Illinois at Urbana-Champaign2012

    … have also been introduced, including very-fast transmission line pulsing (VF-TLP) and capacitively coupled TLP (CC-TLP). This work presents three new wafer-level CDM testers. Two are modifications of existing CC-TLP and “WCDM” testers. The modified testers allow one to probe internal nodes …

    uiuc Repository record