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Showing 1 to 2 of 2 for “"Total Reflection X-ray Fluorescence (TXRF)"”.
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Surface phase emergence and evolution of solid oxide fuel cell cathode materials
… The as-deposited films were characterized by x-ray diffraction (XRD), atomic force microscopy (AFM), Rutherford backscattering spectrometry (RBS) and transmission electron microscopy (TEM). Changes upon heating the films to operating temperature and pressures were characterized using various …