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Showing 1 to 4 of 4 for “"Tip-based nanomanufacturing"”.

  1. Tip-based nanomanufacturing and metrology of heterogeneous nanostructures

    … spectroscopy (AFM-IR). In tDPN, the heated tip of an atomic force microscope cantilever deposits polymer nanostructures onto a surface, where the cantilever heating controls the deposition rate. The nanometer-scale polymer transport between the tip and surface is investigated by controlling …

    uiuc Repository record for Tip-based nanomanufacturing and metrology of heterogeneous nanostructures (opens in a new tab)

  2. Experimentally validated 3D MD model for AFM-based tip-based nanomanufacturing

    <p>In order to control AFM-based TBN to produce precise nano-geometry efficiently, there is a need to conduct a more focused study of the effects of different parameters, such as feed, speed, and depth of cut on the process performance and outcome. This is achieved by experimentally validating a MD …

    purdue-thes Repository record for Experimentally validated 3D MD model for AFM-based tip-based nanomanufacturing (opens in a new tab)

  3. High-throughput plasma nanomanufacturing and its applications

    Traditional top-down or bottom-up nanomanufacturing processes involve nanoscale pre-patterning, surface-area-sensitive assembly processes or extreme fabrication conditions; therefore, none of them meets the requirements of scalable and translational nanomanufacturing processes in one or more …

    uiuc Repository record for High-throughput plasma nanomanufacturing and its applications (opens in a new tab)

  4. Fundamentals of heat transfer and thermal-mechanical control for improved atomic force microscopy

    … for local measurements of material properties, tip-based nanomanufacturing, high-density data storage, and thermal topography imaging. This work focuses on thermal topography imaging wherein the cantilever measures the surface topography by tracking changes in the cantilever heat flow. This work …

    uiuc Repository record for Fundamentals of heat transfer and thermal-mechanical control for improved atomic force microscopy (opens in a new tab)