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Showing 1 to 5 of 5 for “"Test-point Insertion"”.
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Developing a Methodology to Detect Partial Failures for Dynamic Systems
… that experts in the field of failure detection, test point insertion and Built-In-Test Equipment (BITE) can provide useful input in detecting partial failures. Partial failures affect operational system performance and support costs, which can be significant. Often, however, partial failure …
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New Techniques for Logic Built -in Self -Test
… new techniques for logic built-in self-test (BIST) in VLSI chip testing. The main purpose of these techniques is to improve fault coverage for logic BIST with minimal performance penalty and hardware overhead. One technique is the method of constrained scan cells. It overcomes the timing …
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Test and diagnosis of resistive bridges in multi-Vdd designs
… number of challenges for existing manufacturing test and diagnosis techniques, as certain defects exhibit Vdd dependent detectability. This means that to achieve 100% fault coverage, APM-enabled devices should be tested at all operating voltages using repetitive tests. Repetitive tests at several …
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Integrated Enhancement of Testability and Diagnosability for Digital Circuits
While conventional test point insertions commonly used in design for testability can improve fault coverage, the test points selected may not necessarily be the best candidates to aid <em>silicon diagnosis</em>. In this thesis, test point insertions are conducted with the aim to detect more faults …
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Techniques for Seed Computation and Testability Enhancement for Logic Built-In Self Test
With the increase of device complexity and test-data volume required to guarantee adequate defect coverage, external testing is becoming increasingly difficult and expensive. Logic Built-in Self Test (LBIST) is a viable alternative test strategy as it helps reduce dependence on an elaborate …