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Showing 1 to 20 of 75 for “"Test Structures"”.

  1. Electrical characterization of EEPROM test structures

    … Erasable Programmable Read Only Memory (EEPROM) test structures have been studied using Fowler-Nordheim (FN) tunneling and low-frequency noise measurements, both before and after electrical stress. Non-linear FN curves have been observed, which can yield insights into the failure mechanisms of …

    rice Repository record for Electrical characterization of EEPROM test structures (opens in a new tab)

  2. Modeling of micro-electro-mechanical integrated test structures

    Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.

    mit Repository record for Modeling of micro-electro-mechanical integrated test structures (opens in a new tab)

  3. Electrostatically actuated microelectromechanical test structures for material property measurement

    Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.

    mit Repository record for Electrostatically actuated microelectromechanical test structures for material property measurement (opens in a new tab)

  4. A computational investigation of predicting wind tunnel results for selected hypersonic wing test structures

    … is built upon by attempting to model only the test section of the BAM6QT by using a boundary layer profile inlet condition, but results are not confirmed.

    utc Repository record for A computational investigation of predicting wind tunnel results for selected hypersonic wing test structures (opens in a new tab)

  5. Charge Collection Studies on Integrated Circuit Test Structures using Heavy-Ion Microbeams and MEDICI Simulation Calculations

    … robust devices, it is essential to create and test accurate models of induced charge collection and transport in semiconductor devices. A heavy ion microbeam produced by an accelerator is an ideal tool to study charge collection processes in ICs and to locate the weak nodes and structures for …

    unt Repository record for Charge Collection Studies on Integrated Circuit Test Structures using Heavy-Ion Microbeams and MEDICI Simulation Calculations (opens in a new tab)

  6. Study of CMOS process variation by multiplexing analog characteristics

    … thesis addresses this need by contributing a test circuit methodology for the extraction of spatial, layout and size dependent variations at both device and interconnect levels. The test chip uses a scan chain approach combined with low-leakage and low-variation switches, and Kelvin sensing …

    mit Repository record for Study of CMOS process variation by multiplexing analog characteristics (opens in a new tab)

  7. Response of ten story, reinforced concrete model frames to simulated earthquakes

    … and inelastic response of reinforced concrete structures subjected to strong earthquake excitations. This was a part of continuing research supported by National Science Foundation, Grant ENV 7422962. In the experimental phase, test structures made up of ten-story, three-bay frame models (Fig. …

    uiuc Repository record for Response of ten story, reinforced concrete model frames to simulated earthquakes (opens in a new tab)

  8. Optimization Techniques for Phase Retrieval Based on Single-Crystal X-Ray Diffraction Data

    … optimization models for phasing crystal structures from X-ray diffraction data. First, an integer minimal principle for quartets and triplets is proposed for initially setting the phases of structure factors that compose a Karle-Hauptman matrix. Initialization in this manner is motivated …

    uiuc Repository record for Optimization Techniques for Phase Retrieval Based on Single-Crystal X-Ray Diffraction Data (opens in a new tab)

  9. Characterization of pGaN-gate power HEMTs

    … modules were evaluated alongside specialized test structures to enable both system-level and localized analysis. DC measurements using the Keysight B1505A system revealed that more aggressive gate contact schemes improved ON-resistance and transconductance, but often at the cost of increased …

    mit Repository record for Characterization of pGaN-gate power HEMTs (opens in a new tab)

  10. Topological characterization of nanoporous gold during coarsening

    … Using a rolling-ball type algorithm, in which a test probe rolls over the surface to identify atoms, several test structures and a small-scale nanoporous structure were meshed. The genus was then calculated for each of these meshed structures. It was found that an algorithm that accounts for …

    mit Repository record for Topological characterization of nanoporous gold during coarsening (opens in a new tab)

  11. Experiment to Study Earthquake Response of R/c Structures With Stiffness Interruptions

    … the earthquake response of reinforced concrete structures having abrupt interruptions in the lateral-force-resisting elements in adjacent stories. The study comprises both experimental and analytical phases. Experimental work includes earthquake simulation tests of four small-scale, reinforced …

    uiuc Repository record for Experiment to Study Earthquake Response of R/c Structures With Stiffness Interruptions (opens in a new tab)

  12. Pulsed Magnetic Imaging of Broad-Frequency Fields using Nitrogen-Vacancy Centers in Diamond

    … magnetic imager and its capabilities with test structures of varying complexity. We overcome the challenges for measuring MHz frequency magnetic fields with a quantum frequency mixing approach.

    mit Repository record for Pulsed Magnetic Imaging of Broad-Frequency Fields using Nitrogen-Vacancy Centers in Diamond (opens in a new tab)

  13. Comparison of nonlinear finite element formulations: application to trusses

    … element codes. Numerical comparisons of five test structures are carried out using ABAQUS and both programs. ABAQUS serves as the bench-mark by which the solution accuracy of the two programs is judged.

    vt Repository record for Comparison of nonlinear finite element formulations: application to trusses (opens in a new tab)

  14. Failure of Microelectromechanical Systems Under Dynamic Loading: An Experimental and Numerical Investigation

    … response of cantilever beams, representing modle test structures, comprised of metal and ceramic layers was also investigated. Experiments were conducted using the modified split hopkinson pressure bar to investigate the effects of loading amplitude, duration, and profile on the failure of the …

    uiuc Repository record for Failure of Microelectromechanical Systems Under Dynamic Loading: An Experimental and Numerical Investigation (opens in a new tab)

  15. Scaling and process effect on electromigration reliability for Cu/low k interconnects

    … interconnects. For this purpose, EM statistical test structures, having different number of line segments, line width, and via width, were designed. The EM test structures were fabricated by a dualdamascene process with two metal layers (M1/Via/M2), which were then packaged for EM tests. The …

    texas Repository record for Scaling and process effect on electromigration reliability for Cu/low k interconnects (opens in a new tab)

  16. Compact modeling of neutron damage effects in a bipolar junction transistor

    … compare favorably with measured data of BJT test structures. Application of the neutron-effects BJT model in a voltage reference circuit provides critical information for circuit design in a neutron environment.

    unm Repository record for Compact modeling of neutron damage effects in a bipolar junction transistor (opens in a new tab)

  17. Field emission from carbon nanotubes deposited on platinum and nickel/nickel oxide multilayers

    … field emission between the nanotubes and vacuum. Test devices of different work functions were fabricated from platinum and from nickel / nickel oxide. Nickel oxide was deposited by e-beam evaporation or grown by thermal oxidation and characterized by Auger electron spectroscopy, x-ray diffraction …

    mit Repository record for Field emission from carbon nanotubes deposited on platinum and nickel/nickel oxide multilayers (opens in a new tab)

  18. Characterization and modeling of polysilicon MEMS chemical-mechanical polishing

    … to characterize polysilicon MEMS CMP. A new test mask was created which contains test structures relevant to MEMS. Both single and dual material polish experiments were carried out and the resulting data fit against an adapted step height density model. Results show that integrated circuit …

    mit Repository record for Characterization and modeling of polysilicon MEMS chemical-mechanical polishing (opens in a new tab)

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