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Showing 1 to 2 of 2 for “"Test Compaction"”.
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On the generation of test patterns for combinational circuits
… of identification of redundant faults and test pattern compaction are presented. The aim of the research is to improve an existing test pattern generator ATALANTA by incorporating methods for identification of redundant faults and test compaction. The faults are modeled as stuck-at faults …
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Reliability Enhancement in GPU Architectures
L'abstract è presente nell'allegato / the abstract is in the attachment