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Showing 1 to 5 of 5 for “"TXRF"”.
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STUDY AND CHARACTERIZATION OF INNOVATIVE CLEANING METHODS IN MICROELECTRONICS
… cleaning technologies have been compared by: TXRF (after metal contamination of Silicon surfaces), TOF-SIMS, haze and particle counting analysis. Moreover, the chemical oxide (native oxide) thickness, which is formed during the wet cleaning process, has been measured through Opti-probe …
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Surface phase emergence and evolution of solid oxide fuel cell cathode materials
… techniques. Total Reflection X-ray Fluorescence (TXRF) measurements, which probe compositional changes, were made at high temperature in real time. The LSM surfaces were found to develop manganese enrichment when heated. Highly strontium doped LSCF were found to develop strontium-rich surfaces. On …
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Formation and characterization of SrBi 2 Ta 2 O 9 (SBT)thin film capacitor module with Platinum-Titanium bottom and Platinum top electrodes
… are obtained. By using Total X-Ray Fluorescence (TXRF) technique, the loss of bismuth into the Pt electrode is found to be almost 40% higher for Pt/Ti electrodes compared to Pt/TiOx electrodes. This difference in Bi-loss results in different crystallization of SBT at the Pt-SBT interface. For the …