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Showing 1 to 1 of 1 for “"TFT characterization"”.
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Quantitative Extraction of Bias Stress Parameters in Thin Film Transistors
Thin film transistors (TFTs) are widely used in active matrix displays and are finding applications in emerging areas of large-area electronics, such as logic. A key limitation of the practical applications of TFTs is their inherent instability under bias stress. The two leading semiconducting TFT …