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Showing 1 to 1 of 1 for “"Surface work function measurement"”.
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Study of semiconductor and metal surfaces using a novel scanning Kelvin probe.
… Probe is a capacitor device used to measure the work function phi between a vibrating reference electrode (the tip) and the surface under investigation. It utilises a non-contact, non-destructive measurement mode allowing work function measurements at temperatures in the range from (300 - 1100) …