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Showing 1 to 4 of 4 for “"Statistical process control (SPC) charts"”.

  1. SIMULTANEOUS APPLICATION OF MULTIPLE PROCESS CONTROL RULES

    <p>Statistical Process Control (SPC) charts are tools used in quality control to monitor and analyze the stability of a process over time. This study evaluates the effectiveness of eight individual Western Electric rules, also known as WECO rules, and the various combinations of these rules with …

    sfasu Repository record for SIMULTANEOUS APPLICATION OF MULTIPLE PROCESS CONTROL RULES (opens in a new tab)

  2. Pattern recognition for manufacturing process variation using integrated statistical process control – artificial neural network

    Variation in manufacturing process is known to be a major source of poor quality products and variation control is essential in quality improvement. In bivariate cases, which involve two correlated quality variables, the traditional statistical process control (SPC) charts are known to be effective …

    uthm Repository record for Pattern recognition for manufacturing process variation using integrated statistical process control – artificial neural network (opens in a new tab)

  3. A Trigger-Tool-based Description of Adverse Events in Helicopter Emergency Medical Services in Qatar

    … per 100 patient encounters, plotted measures on Statistical Process Control (SPC) charts, and conducted a multivariate analysis to report harm associations. Results We identified 883 Triggers in 536 patients, with a rate of 1.1 Triggers per Patient Encounter, where 81.2% had Documentation Errors …

    cape-town Repository record for A Trigger-Tool-based Description of Adverse Events in Helicopter Emergency Medical Services in Qatar (opens in a new tab)

  4. New control charts for monitoring univariate autocorrelated processes and high-dimensional profiles

    … variance estimators in distribution-free statistical process control (SPC) charts for univariate autocorrelated processes. We introduce two variance estimators---the standardized time series overlapping area estimator and the so-called quick-and-dirty autoregressive estimator---that can be …

    gatech Repository record for New control charts for monitoring univariate autocorrelated processes and high-dimensional profiles (opens in a new tab)