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Showing 1 to 1 of 1 for “"Standard Cell Characterization"”.
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Characterization of the Performance Variation for Regular Standard Cells with Process Non-idealities
In IC manufacturing, the performance of standard cells often varies due to process non-idealities. Some research work on 2-D cell characterization shows that the timing variations can be characterized by the timing model. However, as regular design rules become necessary in sub-45 nm node circuit …