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Showing 1 to 9 of 9 for “"Single Event Upset (SEU)"”.
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Automated incorporation of upset detection mechanisms in distributed Ada systems
… approach to developing software that performs single event upset (SEU) detection in distributed Ada systems. Faults considered are those that fall in the single event upset (SEU) category. SEUs may cause information corruption leading to a change in program flow or causing a program to execute …
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Silicon Germanium SRAM and ROM Designs for Wide Temperature Range Space Applications
… the design against total ionizing dose (TID), single-event upset (SEU), and single-event latch-up (SEL). The memory arrays are also designed to operate over the wide temperature range of -180 °C to 125 °C. Design, simulation, and physical layout are evaluated throughout the process. Modeling of …
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Setmap: a soft error tolerant mapping algorithm for FPGA designs with low power
… SVmap and Emap, respectively, we reduce the single event upset (SEU) rate by 30.5% with a 3.7% power overhead penalty and 50.1% with a 4.7% power overhead penalty using six-input LUTs. When multi-event upset (MEU) occurs, our work reduces the soft error rate by 33% and 31.5% for double bit …
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Development and Characterisation of a Radiation Hard Readout Chip for the LHCb-Experiment
… with the I2C-standard and the control logic for event readout have been implemented. A scheme has been developed which ensures the robustness of the Beetle chip against Single Event Upset (SEU). This includes the consistent use of triple-redundant memory devices together with a self-triggered …
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Development, Optimisation and Characterisation of a Radiation Hard Mixed-Signal Readout Chip for LHCb
… performance, several irradiation tests and an Single Event Upset (SEU) test were performed. A long-time measurement with a silicon strip detector was also part of this work as well as the development and test of a first mass production test setup. The Beetle chip showed no functional failure …
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Estimating the Dynamic Sensitive Cross Section of an FPGA Design through Fault injection
… fault injection tool has been created to emulate single event upset (SEU) behavior within the configuration memory of an FPGA. This tool is able to rapidly and accurately determine the dynamic sensitive cross section of the configuration memory for a given FPGA design. This tool enables the …
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Charge Collection Studies on Integrated Circuit Test Structures using Heavy-Ion Microbeams and MEDICI Simulation Calculations
… produce what is called a "soft" error, or Single Event Upset (SEU). Therefore, the response of ICs to natural radiation is of great concern for the reliability of future devices. Immunity to soft errors is listed as a requirement in the 1997 National Technology Roadmap for Semiconductors …
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Characterizing Single Event Upsets within the lpGBT-based End-of-Substructure Card
… in an erroneous change in logic known as a Single Event Upset (SEU). The lpGBT is a radiation tolerant ASIC and employs digital signal processing (DSP) and triple modular redundancy (TMR) techniques to mitigate against the effects of SEUs on transmitted data. This thesis presents an …