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Showing 1 to 1 of 1 for “"Si/SiO₂ interface"”.
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First principles-based atomistic modeling of the structural properties of silicon-oxide nanomaterials
… network (CRN) model based Metropolis Monte Carlo simulation tools which are capable of predicting the structural properties of amorphous semiconductor and oxide materials as well as their interface. To bolster the reliability of the CRN model, we have developed force fields based on gradient …