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Showing 1 to 1 of 1 for “"Serial-section FIB-SEM tomography"”.
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Tomographic reconstruction and sub-surface imaging of porous nitride semiconductors
… structural characterisation of porous nitride semiconductors and apply those methods to further our understanding of these materials. I investigated nanostructured nitrides through porous GaN distributed Bragg reflectors (DBRs), highly-reflective and wavelength-selective mirrors for …