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Showing 1 to 3 of 3 for “"Secondary electron imaging"”.

  1. Sputter deposition and plasma modification of tungsten alloys for nuclear fusion applications

    … Surface morphology changes were tracked with secondary electron imaging. At 800◦C, surface pits were seen, which were larger in a pure tungsten film than in low concentration alloy films. Advanced surface roughening was observed in the chromium films, while a high concentration tantalum film …

    aus-cath Repository record for Sputter deposition and plasma modification of tungsten alloys for nuclear fusion applications (opens in a new tab)

  2. Sputter deposition and plasma modification of tungsten alloys for nuclear fusion applications

    … Surface morphology changes were tracked with secondary electron imaging. At 800◦C, surface pits were seen, which were larger in a pure tungsten film than in low concentration alloy films. Advanced surface roughening was observed in the chromium films, while a high concentration tantalum film …

    anu Repository record for Sputter deposition and plasma modification of tungsten alloys for nuclear fusion applications (opens in a new tab)

  3. Progress towards quantitative dopant profiling with the scanning electron microscope

    … technique with high spatial resolution. Secondary electron (SE) imaging in the scanning electron microscope (SEM) has been shown to be a very promising technique for dopant profiling in the past. However, the limited accuracy obtained with SE imaging (> ±20% dopant sensitivity) has …

    cambridge Repository record for Progress towards quantitative dopant profiling with the scanning electron microscope (opens in a new tab)