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Showing 1 to 4 of 4 for “"Scanning ion conductance microscopy"”.
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Two-Electrode Voltage Clamp (TEVC) Based Scanning Ion Conductance Microscopy: New Methodology and Validation
Scanning ion conductance microscopy (SICM) is a scanning probe technique that utilizes an electrolyte filled glass-pipette to recover the topography of a non-conductive sample in an electrolyte solution. This technique monitors the change in current that is caused by a change of resistance through …
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Anwendungen der Ionenleitfähigkeitsmikroskopie in der Biophysik
In dieser Arbeit wird ein kombiniertes Rasterionenleitfähigkeits-/Weitfeldfluoreszenzmikroskop entwickelt. Die Zusammenführung der verschiedenen Techniken erlaubt das Erforschen neuer, unkonventioneller Methoden in der Biophysik. Die Weitfeldfluoreszenzmikroskopie bietet in Kombination mit …
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Localised Dosing and Nanodetection Using a Novel Scanning Ion Conductance Microscope and Its Application to Alzheimer's Disease
Scanning ion conductance microscopy (SICM) is a technique for non-contact topographic imaging. In this thesis, a biophysical investigation into Alzheimer's Disease (AD) was carried, with toxic oligomers dosed locally and quantitatively on to single astrocytes using SICM and simultaneously …
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Novel Fabrication and Characterization Methods for Conducting Polymer Nanostructures and Microstructures
… novel experimental techniques for the fabrication and characterization of poly(3,4-ethylenedioxythiophene) (PEDOT) and polyaniline (PANI), two prominent conducting polymers. Many of the strategies presented herein are based on miniaturized pipettes driven by scanning ion conductance microscopy …