Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
Results
Showing 1 to 3 of 3 for “"Scanning helium microscopy"”.
-
Instrumentation and contrast mechanisms in scanning helium microscopy
Scanning helium microscopy (SHeM) is a novel form of microscopy that uses low energy (5-100 meV) helium atoms to image the surface of a sample. Since helium is inert and neutral, it can be used to study delicate and insulating surfaces, but that also means it can be difficult to manipulate for …
-
The formation of contrast in scanning helium microscopy
The formation of contrast in scanning helium microscopy Over the last decade a new microscopy technique has emerged that uses neutral helium atoms as the probe particles. It has been termed scanning helium microscopy (SHeM), also known as neutral atom microscopy (NAM). SHeM produces helium atom …