Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 4 of 4 for “"Scanning Microwave Impedance Microscopy"”.
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Characterization of electrical conductivity of carbon fiber/epoxy composites with conductive AFM and scanning microwave impedance microscopy
… –based techniques: Conductive AFM (C-AFM) and Scanning Microwave Impedance Microscopy (sMIM). Unidirectional IM7/977-3 carbon fiber/epoxy laminates were manufactured and examined with these two techniques. C-AFM was used to measure the bulk resistivity of IM7 fibers at (1.9 ± 1.1) x 10-3 Ω∗cm. …
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Development of a multipurpose near-field imaging platform
… idea of combining the high spatial resolution of scanning probe microscopy (SPM) with traditional optical imaging techniques has been revolutionizing for multiple fields - Condensed Matter Physics, Material Science, Chemistry, and Biology. This high potential is met with the special requirements …
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Carrier transport, recombination, and the effects of grain boundaries in polycrystalline cadmium telluride thin films for photovoltaics
… majority carrier concentration was studied using scanning microwave impedance microscopy, which revealed an existence of majority carrier depletion along the grain boundaries, independent of the growth process used, which was absent in films that were not subjected to CdCl2 annealing. This effect …
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Advanced characterization of 4H-SiC MOSFET channel [Caratterizzazione avanzata del canale 4H-SiC MOSFET]
Lo sviluppo di MOSFET di potenza ad alte prestazioni in carburo di silicio (SiC) rappresenta un passo fondamentale per l'avanzamento della moderna elettronica di potenza. Grazie all'ampio bandgap, all'elevata conducibilità termica e all'alto campo elettrico, il 4H-SiC è emerso come materiale …