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Showing 1 to 5 of 5 for “"Scanning Kelvin Probe Microscopy"”.

  1. Investigation of Surface States and Device Surface Charging in Nitride Materials Using Scanning Kelvin Probe Microscopy

    In this work Scanning Kelvin Probe Microscopy (SKPM) was used to characterize surface states and device surface charging in nitride materials. Samples grown by Molecular Beam Epitaxy (MBE), Metal Organic Chemical Vapor Deposition (MOCVD) and Hydride Vapor Phase Epitaxy (HVPE) typically show a high …

    vcu Repository record for Investigation of Surface States and Device Surface Charging in Nitride Materials Using Scanning Kelvin Probe Microscopy (opens in a new tab)

  2. Local Charging Behavior on GaN Surfaces

    … studied by measuring the surface potential with scanning Kelvin probe microscopy (SKPM). The charging and discharging behavior of the surface appears to be strongly influenced by surface preparation and the presence of a surface oxide layer. If a substantial oxide layer exists, then both positive …

    vcu Repository record for Local Charging Behavior on GaN Surfaces (opens in a new tab)

  3. Formation of screen-printed contacts on multicrystalline silicon (mc-Si) solar cells

    … of phosphorous occurs during Si-Ag interaction. Scanning Kelvin Probe Microscopy profiles have been studied to measure the surface potential of the metal semiconductor region. Current Voltage characteristics of the fired cells are presented. An improved technique to cross-section large lengths of …

    njit Repository record for Formation of screen-printed contacts on multicrystalline silicon (mc-Si) solar cells (opens in a new tab)

  4. Cellulose Nanocrystals: Size Characterization and Controlled Deposition by Inkjet Printing

    … and thickness distributions by atomic force microscopy (AFM) and dynamic light scattering. Aqueous CNC suspensions were characterized in terms of shear viscosity with a rheometer. Glass substrates were cleaned with a detergent solution, aqua regia, or a solvent mixture, and characterized in …

    vt Repository record for Cellulose Nanocrystals: Size Characterization and Controlled Deposition by Inkjet Printing (opens in a new tab)

  5. Non-destructive Electrical Characterization of Controlled Waspaloy Microstructures

    … as Ultra Small Angle X-ray Scattering (USAXS), Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD) to gain a complete understanding of the microstructural transformations and the associated mechanisms. Three different sets of controlled microstructures were produced in this research. …

    gatech Repository record for Non-destructive Electrical Characterization of Controlled Waspaloy Microstructures (opens in a new tab)