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Showing 1 to 4 of 4 for “"Scanning Joule Expansion Microscopy (SJEM)"”.
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Modeling of Joule heating and thermoelectric transport in thin film silicon for SJEM measurement
… replicates data acquisition technique of Scanning Joule expansion microscopy (SJEM). Time varying heat equations and Maxwell’s equations are solved in frequency domain and applied to commercial finite element software, COMSOL. Chapter 1 introduces various techniques to obtain nanoscale …
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Advanced purification of aligned arrays of single-walled carbon nanotubes
… substrates. We develop a nanoscale thermometry-scanning Joule expansion microscopy (SJEM) for quantitative assessments of the low temperature nature associated with this process. Measurements combined with simulations fully reveal the essential physics of the thermocapillary flows. We also …
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Nanometer-scale temperature measurements of phase change memory and carbon nanomaterials
… work develops and implements an atomic force microscopy (AFM) based nanometer-scale thermometry technique, known as scanning Joule expansion microscopy (SJEM), to measure nanometer-scale heat generation in new graphene and phase change memory (PCM) devices, which have potential to improve …
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Quantitative nanometer-scale thermal metrology using scanning joule expansion microscopy
Item marked as restricted to the 'UIUC Users [automated]' Group (id=2) by William Ingram (wingram2@illinois.edu) on 2011-05-25T14:41:49Z Item is restricted until 2013-05-25T14:41:28Z