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Showing 1 to 20 of 41 for “"Rutherford backscattering spectrometry"”.
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APPLICATION OF RUTHERFORD BACKSCATTERING SPECTROMETRY IN NONDESTRUCTIVE ANALYSIS.
A Rutherford backscattering spectrometry facility has been designed and built at the University of Arizona. Initial calibration and testing has been carried out in order to accurately characterize the system and make it ready to perform reliable analyses. Also, an explanation of basic RBS …
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Sol-gel coatings containing inorganic and organic compounds--studies using Rutherford backscattering spectrometry and UV-VIS spectroscopy
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1990.
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Changes in the near-surface stress in titanium caused by krypton ion-implantation
… through scanning electron microscopy (SEM). Rutherford backscattering spectrometry (RBS) was also used to determine the dose and depth of implanted krypton. The krypton profiile in titanium, and the associated damage profile, was modelled with TRIM calculations. In addition, metallurgical …
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Radiation-Induced Segregation and Precipitation in Ion-Irradiated Molybdenum-Rhenium Alloys
… was measured during irradiation by in situ Rutherford backscattering spectrometry (RBS). The results of the segregation measurements were in agreement with theoretical models based on point-defect driven transport of solute atoms toward point-defect sinks.
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Deposition of Metal Oxides and Metal Carbonyls on Silicon Surfaces Using Solution Chemistry
… deposited on the surface were obtained using Rutherford backscattering spectrometry. X-ray photoelectron spectroscopy analysis furnished the chemical state of the adsorbates as well as quantitative information. Static secondary ion mass spectrometry analysis detected the presence of the …
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Partitioning and Diffusivity of arsenic(III) in the Active Layer of Thin-Film Composite Reverse Osmosis and Nanofiltration Membranes
… was also investigated. This study introduced Rutherford backscattering spectrometry (RBS) into the membrane field. Major achievements were made from three perspectives: (1) successful characterization of membrane physico-chemical properties, including elemental composition, thickness and …
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The effects of annealing on phase transformation in platinum-molybdenum coatings
… microscope, energy dispersive X-ray emission and Rutherford backscattering spectrometry. The phase analysis showed the presence of several intermetalic phases, Pt2Mo, PtMo and Pt2Mo3 which were observed to nucleate in sequence when the annealing time and temperature were extended. RBS analysis …
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Growth and characterisation of thin film superconductors on oxides, silicon and silicides
… for both these techniques have been determined. Rutherford backscattering spectrometry is used to obtain thickness and stoichiometry information, while X-ray diffraction gave phase and orientational data. Ion channeling was used for structural analysis and Auger electron spectroscopy was used to …
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Investigation of implantation damage in aluminum gallium arsenide/gallium arsenide heterostructures using ion channeling and transmission electron microscopy
… analyzed using low-, room-, and high-temperature Rutherford backscattering spectrometry ion channeling and room-temperature transmission electron microscopy techniques. In all implantations the level of damage produced in these structures was found to increase with depth, and the damage state …
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Boron and phosphorous implantation into (100) germanium : modeling and investigation of dopant annealing behavior
… were characterized using secondary ion mass spectrometry (SIMS), spreading resistance profiling (SRP) measurements, Hall Effect measurement, X-ray diffraction (XRD) measurement, and Rutherford backscattering spectrometry (RB S). A predictive model for the implanted dopant distribution's …
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Application of Disorder-Induced Melting Concept to Fracture
… determined by sulfur implantation into nickel; Rutherford backscattering spectrometry is used to determine the implantation profile in thin-film specimens, and it is also used to monitor the C → A transformation in single-crystal specimens. The composition dependence for intergranular …
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Nanofiltration membranes modified with aromatic polyamide dendrimers active layers
… membrane structures are further characterized by Rutherford backscattering spectrometry (RBS) and atomic force microscopy (AFM) techniques, suggesting a low-level accumulation of dendrimers inside the TFC-S NF membranes and subsequent formation of an additional aramide dendrimer active layer. …
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A Novel Process for GeSi Thin Film Synthesis
… oxidation kinetics of Ge-ion implanted silicon. Rutherford backscattering spectrometry (RBS), ion channeling, Raman spectroscopy and scanning electron microscopy (SEM) were used as the characterization techniques.
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Effect Of Germanium Doping On Erbium Sensitization In The Erbium Doped Silicon Rich Silica Material System
… of the deposited materials was verified by Rutherford Backscattering Spectrometry. Samples from each deposition were annealed in a controlled atmosphere tube furnace at temperatures between 500ºC and 1100ºC for 30 minutes. The photoluminescence spectra from the visible to the near-infrared …
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Recrystallisation Of Strontium Titanate
… reflectivity (TRR) has been combined with Rutherford backscattering spectrometry (RBS) and ion channelling to investigate this effect. Thin amorphous films were produced on single crystal substrates of (100) strontium titanate by ion bombardment. Specimens were annealed under controlled …
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Analyse struktureller Defekte in kristallinen Schichten
… sich Untersuchungen mit nuklearen Methoden wie Rutherford Backscattering Spectrometry (RBS), Nuclear Reaction Analysis (NRA) oder Channeling durchführen, um Festkörper zu analysieren. <br>In der vorliegenden Arbeit wurden Ionenstrahltechniken zur Element- und Strukturanalyse sowohl von Diamant-, …
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The application of Bayesian statistics and maximum entropy to Ion beam analysis techniques
… The results of this method of deconvoluting Rutherford Backscattering Spectrometry (RBS) and Proton Induced X-ray Emission (PIXE) spectra are compared to the results from other deconvolution techniques, namely Fourier Transforms, Jansson's method and maximum entropy (MaxEnt) without pixons. …
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Surface phase emergence and evolution of solid oxide fuel cell cathode materials
… (XRD), atomic force microscopy (AFM), Rutherford backscattering spectrometry (RBS) and transmission electron microscopy (TEM). Changes upon heating the films to operating temperature and pressures were characterized using various synchrotron x-ray techniques. Total Reflection X-ray …
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Effects of Xe ion irradiation of ZrN and the migration behaviour of implanted Eu
… were characterized by Raman spectroscopy and Rutherford backscattering spectrometry (RBS). GIXRD results con rmed the nano-crystallinity of the deposited ZrN layer. Raman spectroscopy results of the as-deposited ZrN, exhibited all rst-order Raman scattering bands indicating a ZrN structure …
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Diffusion and the thermal stability of amorphous copper-zirconium
… impurities, by means of Auger electron spectrometry (AES) and Rutherford backscattering spectrometry (RBS). Thermal measurements were made by differential scanning calorimetry (DSC) up to 550 C. The diffusion coefficients of Ag and Au in amorphous CU50zr50 are found to be somewhat higher …
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