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Showing 1 to 1 of 1 for “"Recursive estimation of cantilever"”.
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Model mismatch paradigm for probe based nanoscale imaging.
… (SPMs) are widely used for investigation of material properties and manipulation of matter at the nanoscale. These instruments are considered critical enablers of nanotechnology by providing the only technique for "direct" observation of dynamics at the nanoscale and affecting it with sub …