Global ETD Search

Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.

Results

Showing 1 to 1 of 1 for “"Reciprocal Lattice Mapping"”.

  1. Structural and Morphological Analyses of Aln and Algan Layers

    … based deep-UV device structures. Due to highly lattice mismatched hetero epitaxial growth of deep-UV structures on sapphire substrates, the efficiency of Deep UV LEDs is greatly reduced. Misfit dislocations originated at the interface between AlN epilayer and sapphire substrate is one of the …

    south-carolina Repository record for Structural and Morphological Analyses of Aln and Algan Layers (opens in a new tab)