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Showing 1 to 6 of 6 for “"Post-silicon debug"”.

  1. System-level trace signal selection for post-silicon debug using linear programming

    … using NoC (network- on-chip) communication, post-silicon validation has become and arduous task that consumes much of the development time of the product. The process of finding the root cause of bugs found in post-silicon validation has proven to be much more difficult than in pre-silicon

    uiuc Repository record for System-level trace signal selection for post-silicon debug using linear programming (opens in a new tab)

  2. Scalable functional validation of next generation SoCs

    … challenges include observability enhancement and debug and diagnosis under the constraint of vertical integrations, identifying high-quality verification artifacts among others. In industrial practice, SoC validation is a manual, unsystematic, and ad hoc process that heavily relies on the …

    uiuc Repository record for Scalable functional validation of next generation SoCs (opens in a new tab)

  3. Novel Architectures for Trace Buffer Design to facilitate Post-Silicon Validation and Test

    Post-Silicon validation is playing an increasingly important role as more chips are failing in the functional mode due to either manufacturing defects escaped during scan-based tests or design bugs missed during pre-silicon validation. Critical to the diagnosis engineer is the ability to observe as …

    vt Repository record for Novel Architectures for Trace Buffer Design to facilitate Post-Silicon Validation and Test (opens in a new tab)

  4. Algorithms and Low Cost Architectures for Trace Buffer-Based Silicon Debug

    An effective silicon debug technique uses a trace buffer to monitor and capture a portion of the circuit response during its functional, post-silicon operation. Due to the limited space of the available trace buffer, selection of the critical trace signals plays an important role in both minimizing …

    vt Repository record for Algorithms and Low Cost Architectures for Trace Buffer-Based Silicon Debug (opens in a new tab)

  5. A truly embedded test structure for design-for-manufacturability, hardware security and VLSI testing

    … in several contexts including defect detection, post-silicon debug and hardware-security. In this dissertation, I propose a high-precision and low-overhead embedded test structure, called REBEL, for measuring path delays in the circuit context. REBEL is minimally invasive to the design, as it …

    unm Repository record for A truly embedded test structure for design-for-manufacturability, hardware security and VLSI testing (opens in a new tab)

  6. Robust and reliable hardware accelerator design through high-level synthesis

    … stages in the hardware design and use cycle: pre-silicon debugging, post-silicon validation, and post-deployment error detection. Our solution for rapid pre-silicon debugging of accelerator designs is hybrid tracing: comparing a datapath-level trace of hardware execution with a reference software …

    uiuc Repository record for Robust and reliable hardware accelerator design through high-level synthesis (opens in a new tab)