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Showing 1 to 9 of 9 for “"Particle Induced X-ray emission"”.
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ANALYTICAL APPLICATIONS OF PARTICLE INDUCED X-RAY EMISSION (PIXE) SPECTROSCOPY
Quantitative multielemental analysis using Particle Induced X-ray Emission (PIXE) using 1 and 2 MeV proton bombardment on thin targets has been achieved. The method is based on the calculation of atomic ratios from experimentally determined relative x-ray efficiency curves. Sample preparation …
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Numerical modeling study of a neutron depth profiling (NDP) system for the Missouri S&T reactor
… This work discusses the possibility of coupling Particle Induced X-ray Emission spectroscopy with Neutron Depth Profiling to yield additional information about the depth profiles of other elements within a material. The technical feasibility of developing such a system at the Missouri University …
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External proton beam analysis of plasma facing materials for magnetic confinement fusion applications
… divertor tiles from the Alcator C-Mod tokamak. A Particle Induced Gamma Emission (PIGE) technique was developed for boron depth profiling. In addition, Particle Induced X-ray Emission (PIXE) was implemented and used for a comprehensive study of poloidal tungsten migration in the C-Mod divertor. A …
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Micro PIXE analyses of Furnace and Converter Mattes for the determination of trace element distribution and concentrations
Analyses of the constituent matte phases by Particle Induced X-ray emission (PIXE) were performed to investigate the distribution and concentration of trace elements. These levels of sensitivity are beyond that of the electron microprobe. The objective of these analyses was to examine low level …
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The Stopping of Energetic Si, P and S Ions in Ni, Cu, Ge and GaAs Targets
… The GaAs films were characterized using X-ray Photoelectron Spectroscopy (XPS) and Particle Induced X-ray Emission (PIXE). These films were used to investigate the stopping powers of energetic heavy ions in GaAs and to provide data for the calculation of Bethe-Bloch parameters in the …
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Annealing effects on platinum coating morphology
… (EDS), Atomic force microscope (AFM), X-ray diffraction (XRD), Rutherford backscattering spectroscopy (RBS), and Particle induced X-ray emission (PIXE) were used to characterise the coated systems in terms of surface morphology, identification of intermetallics and elemental distribution. …
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SET-UP OF INNOVATIVE EXPERIMENTAL METODOLOGIES FOR THE ATMOSPHERIC AEROSOL CHARACTERISATION AND SOURCE APPORTIONMENT
… out: 1) set-up of an ED-XRF (Energy Dispersive X-Ray Fluorescence) spectrometer for the analysis of size-segregated samples. During the work, an experimental methodology for this kind of analysis was developed, and the obtained results were validated by an inter-comparison with PIXE technique …
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Growth and characterisation of platinum and palladium catalysed silicon based nanostructures for nano-device fabrication
… confirmed the formation of droplets at 800 °C. Particle induced X-ray emission analysis showed the variation of platinum concentration, in droplets regions, between 1600 and 2000 counts. The surrounding regions were left almost uncovered due to platinum coating dewetting. Work was then carried …