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Showing 1 to 2 of 2 for “"Partial Scan Design"”.
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Selection of flip-flops for partial scan design
Partial scan has served as an alternative solution for test generation for sequential circuits. As only a portion of flip-flops are incorporated into a scan chain in partial scan design, scan flip-flop selection constitutes a key procedure in partial scan. In this thesis, we propose a new way of …
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Efficient Graph Techniques for Partial Scan Pattern Debug and Bounded Model Checkers
… VLSI technology have led to more complex digital designs and shrinking transistor sizes. Due to these developments, design verification and manufacturing test have gained more importance and 70 % of the design expenditure in on validation processes. Electronic Design Automation (EDA) tools play a …