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Showing 1 to 1 of 1 for “"POLYATOMIC IONS, POLYMERS, MULTILAYERS, TOFSIMS, DEPTH PROFILING"”.
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Chemical effects in cluster SIMS depth profiling of polymer-based materials
… the role played by chemistry in the in-depth analysis of polymer-based materials, the importance of which has become relevant with the introduction, in secondary ion mass spectrometry, of cluster ion sources. While the introduction of cluster-SIMS represented a real breakthrough in the …