Global ETD Search

Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.

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Showing 1 to 10 of 10 for “"On-chip Interconnects"”.

  1. Energy- and Reliability-Aware Design of High-Speed Global On-Chip Interconnects.

    … Reliability-Aware Design of High-Speed Global On-Chip Interconnects.

    uic

  2. On-chip networks for manycore architecture

    … the past decade, increasing the number of cores on a single processor has successfully enabled continued improvements of computer performance. Further scaling these designs to tens and hundreds of cores, however, still presents a number of hard problems, such as scalability, power efficiency and …

    mit Repository record for On-chip networks for manycore architecture (opens in a new tab)

  3. GeSi photodetectors and electro-absorption modulators for Si electronic-photonic integrated circuits

    The silicon electronic-photonic integrated circuit (EPIC) has emerged as a promising technology to break through the interconnect bottlenecks in telecommunications and on-chip interconnects. High performance photonic modulators and photodetectors compatible with Si complimentary metal oxide …

    mit Repository record for GeSi photodetectors and electro-absorption modulators for Si electronic-photonic integrated circuits (opens in a new tab)

  4. Rigorous Electromagnetic Modeling of Conductor and Substrate Losses for High -Speed Interconnect Structures

    This dissertation focuses on the electromagnetic modeling of planar layered interconnect structures. This broad class of transmission lines includes structures ranging from on-chip interconnects, thin film, and ceramic multichip modules to printed circuit boards. While similar, these wiring …

    uiuc Repository record for Rigorous Electromagnetic Modeling of Conductor and Substrate Losses for High -Speed Interconnect Structures (opens in a new tab)

  5. Methodologies, Architectures, and Prototypes for Scaling On- and Off-Chip Interconnects

    … to embrace parallelism, both within single chips and across multiple compute devices, in order to meet the growing computational demands. Efficient data movement, both on-chip and off-chip, has thus become increasingly critical. However, scaling on- and off-chip interconnects each presents …

    cornell Repository record for Methodologies, Architectures, and Prototypes for Scaling On- and Off-Chip Interconnects (opens in a new tab)

  6. Studying the effect of Cu microstructure on electromigration reliability using statistical simulation

    Electromigration (EM) describes the mass transport in a metal driven by the momentum transfer from electron scattering with metal ions. This can develop into a degradation process due to void growth for on-chip interconnects when subjected to high electric current densities and eventual …

    texas Repository record for Studying the effect of Cu microstructure on electromigration reliability using statistical simulation (opens in a new tab)

  7. Data-Driven Programming Abstractions and Optimization for Multi-Core Platforms

    … in the future. As the number of cores on a chip rises, the complexity of memory systems and on-chip interconnects increases drastically. The programmer inherits this complexity in the form of new responsibilities for task decomposition, synchronization, and data movement within an …

    columbia-diss Repository record for Data-Driven Programming Abstractions and Optimization for Multi-Core Platforms (opens in a new tab)

  8. Models and Techniques for Green High-Performance Computing

    … at the allocated power budget. In this dissertation, we develop a series of models and techniques to manage power at micro-, meso-, and macro-levels of the system hierarchy, specifically addressing data movement and heterogeneity. We target the chip interconnect at the micro-level, heterogeneous …

    vt Repository record for Models and Techniques for Green High-Performance Computing (opens in a new tab)

  9. Electromigration-Induced Interconnect Aging and its Repercussions on the Performance of Nanometer-Scale VLSI Circuits

    Modern electronic machines are powered by the integrated-circuit (IC), a semiconductor device consisting of compact electronic circuits on a silicon substrate. ICs can contain over a billion fundamental computing elements (transistors) that are connected by a network of metal wires called …

    umn Repository record for Electromigration-Induced Interconnect Aging and its Repercussions on the Performance of Nanometer-Scale VLSI Circuits (opens in a new tab)