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Showing 1 to 2 of 2 for “"Neutral atom microscopy"”.
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The formation of contrast in scanning helium microscopy
The formation of contrast in scanning helium microscopy Over the last decade a new microscopy technique has emerged that uses neutral helium atoms as the probe particles. It has been termed scanning helium microscopy (SHeM), also known as neutral atom microscopy (NAM). SHeM produces helium atom …