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Showing 1 to 1 of 1 for “"Neutral atom microscope"”.
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Instrumentation and contrast mechanisms in scanning helium microscopy
… that uses low energy (5-100 meV) helium atoms to image the surface of a sample. Since helium is inert and neutral, it can be used to study delicate and insulating surfaces, but that also means it can be difficult to manipulate for focussing and detection. The first reflection mode helium …