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Showing 1 to 1 of 1 for “"Nanocharacterization"”.
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Nanocharacterization of Porous Materials with Atomic Force Microscopy
<p><em>Scanning Probe Microscopy techniques have proven very useful in the investigation of porous nanostructured surfaces. Especially, Atomic Force Microscopy (AFM) has been widely used due to its compatibility with non-conducting surfaces. In particular, AFM often complements other techniques …