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Showing 1 to 1 of 1 for “"Middle-of-line time-dependent dielectric breakdown"”.
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Reliability and Data Analysis of Wearout Mechanisms for Circuits
The objective of this research is to develop methodologies for the failure analysis of circuits, as well as investigate the factors for accelerating testing for front-end-of-line time-dependent dielectric breakdown (FEOL TDDB). The separation of wearout mechanisms for circuits will be investigated, …