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Showing 1 to 1 of 1 for “"Microwave Reflectance Photoconductance Decay"”.

  1. Tensile-strained Germanium via III-V Heterostructures for Emerging Electronic and Photonic Applications

    … for strain and lattice parameter determination, microwave-reflectance photoconductive decay (μ-PCD) to quantify effective carrier lifetimes τeff, and atomic force microscopy (AFM) for surface morphology assessment. Through iterative refinement of epitaxial growth parameters, defect-limited τeff …

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