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Showing 1 to 2 of 2 for “"MOL TDDB"”.
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Reliability and Data Analysis of Wearout Mechanisms for Circuits
… time-dependent dielectric breakdown (FEOL TDDB). The separation of wearout mechanisms for circuits will be investigated, and the identification of failure modes for the failure samples will be analyzed. SRAMs and ring oscillators will be used to study the failure modes. The systematic and …
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Semantic autoencoder for modeling dielectric lifetime distributions
Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2025-10-19 without embargo terms