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Showing 1 to 4 of 4 for “"Low temperature characterization"”.
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LOW-TEMPERATURE CHARACTERIZATION OF A 1.55-μm MULTIPLE-QUANTUM-WELL LASER DOWN TO 10 K
… structure was characterized from room temperature down to 10 K. The temperature dependence of important laser parameters, such as threshold current, differential efficiency, emission wavelength, and series resistance, extracted from conventional L-I/I-V and spectral measurements, is …
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Processing Ion Beam Mixed Nickel/Polyimide Thin Films
… using thermal evaporation. We then used the low-temperature characterization system in the Materials Physics Testing lab at SMSU to measure the resistance of each film as a function of temperature. These methods have been described thoroughly as a reference for future research. Measurements …
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High mobility germanium MOSFETs : study of ozone surface passivation and n-type Dopant channel implants combined with ALD dielectrics
… electron mobility enhancement, particularly at low inversion densities. Ge n-FETs receiving channel implants of As or Sb along with the ozone surface passivation exhibit effective electron mobilities higher than Si electron mobility under some conditions of surface electric field for the first …
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HfO2 as gate dielectric on Si and Ge substrate
… by various techniques. Many of them require high temperature annealing that can impact device performance and reliability. In this research, electrical characteristics of capacitors with HfO_2 as gate dielectric deposited by standard thermal evaporation and e-beam evaporation on Si and Ge …