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Showing 1 to 1 of 1 for “"Long Trace Profiler"”.

  1. Optical instruments for characterization in the nano-scale

    … to nanometer precision in part one, and the Long Trace Profiler/Optical Slope Measurement System for characterization of line spacing errors in X-ray blazed synchrotron diffraction gratings to the Angstrom scale in part two. Quantum dots have long been a reliable label in single-molecule …

    uiuc Repository record for Optical instruments for characterization in the nano-scale (opens in a new tab)