Global ETD Search

Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.

Results

Showing 1 to 1 of 1 for “"Layered tunnel barrier"”.

  1. Characterization of ultrathin gate dielectrics and multilayer charge injection barriers

    … ultrathin regime (<35 A) feature a large direct tunneling leakage current. The presence of this leakage current requires a reevaluation of standard characterization techniques as well as a reevaluation of the continued usefulness of SiO_2 as the gate dielectric of choice for future applications. …

    njit Repository record for Characterization of ultrathin gate dielectrics and multilayer charge injection barriers (opens in a new tab)