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Showing 1 to 1 of 1 for “"Layered tunnel barrier"”.
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Characterization of ultrathin gate dielectrics and multilayer charge injection barriers
… ultrathin regime (<35 A) feature a large direct tunneling leakage current. The presence of this leakage current requires a reevaluation of standard characterization techniques as well as a reevaluation of the continued usefulness of SiO_2 as the gate dielectric of choice for future applications. …