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Showing 1 to 2 of 2 for “"LFSR Reseeding"”.
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Techniques for Seed Computation and Testability Enhancement for Logic Built-In Self Test
… fault coverage achievable with random vectors. LFSR reseeding is used to increase the coverage. However, to achieve satisfactory coverage, one often needs a large number of seeds. Computing a small number of seeds for LBIST reseeding still remains a tremendous challenge, since the vectors needed …
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Techniques for Enhancing Test and Diagnosis of Digital Circuits
Test and Diagnosis are critical areas in semiconductor manufacturing. Every chip manufactured using a new or premature technology or process needs to be tested for manufacturing defects to ensure defective chips are not sold to the customer. Conventionally, test is done by mounting the chip on an …