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Showing 1 to 3 of 3 for “"LBIST"”.
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Techniques for Enhancing Test and Diagnosis of Digital Circuits
… all faults. Logic Built-in Self-Test (LBIST) is an alternative methodology for testing, wherein all components needed to test the chip are on the chip itself. This eliminates the need of expensive ATEs and allows for at-speed testing of chips. However, there is hardware overhead …
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Techniques for Seed Computation and Testability Enhancement for Logic Built-In Self Test
… and expensive. Logic Built-in Self Test (LBIST) is a viable alternative test strategy as it helps reduce dependence on an elaborate external test equipment, enables the application of a large number of random tests, and allows for at-speed testing. The main problem with LBIST is suboptimal …
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Manufacturing and In-Field Testing Techniques
L'abstract è presente nell'allegato / the abstract is in the attachment