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Showing 1 to 17 of 17 for “"KPFM"”.
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Kelvin Probe Force Microscopy on Graphene Thin Films for Solar Cell and Biosensing Applications
… using Kelvin Probe Force Microscopy (KPFM) in the dark and under light irradiation. In our study, we have also demonstrated the fabrication of photovoltaic devices from cost-effective, water-soluble, and bio-sensitive acridine orange molecules. We investigated the morphology and work …
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Charged ferroelectric domain walls: the next generation in 2D functional materials
… in AFM such as Kelvin probe force microscopy (KPFM) to spatially map the Hall potential on the nanoscale. This allowed the behaviour of the wall to be established independently of the influence of the surrounding domain and the contact resistances at electrodes.<br/><br/>Mobilities of …
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Oberflächenphotospannung an dünnen organischen Schichten auf Metallsubstraten
… und die Kelvin-Sonden-Rasterkraftmikroskopie (KPFM) werden als weitere Möglichkeiten zur Bestimmung des Ober?ächenpotentials vorgestellt. Die Photospannung wird mit diesen Methoden in Bezug auf drei Parameter untersucht: Da die Barriere an der Grenz?äche, welche für die Ausbildung der …
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Kelvinsondenmikroskopie an organischen Dünnschicht-Halbleitern:Einfluss der Schichtprozessierung auf elektrische, optische und morphologische Eigenschaften organischer Solarzellen
… Ermittlung der Kontaktpotenziale durch die KPFM-Methode.
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Two-Dimensional Titanium Carbide MXene for Lithium-ion Conductive Solid-state Electrolytes
… (AFM), and Kelvin probe force microscopy (KPFM) to evaluate its structural and morphological properties. To explore the potential of 2D Ti3C2Tx MXene in SPEs, the MXene were integrated into three different polymer matrices and the resulting SPEs were evaluated through a suite of advanced …
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Electrodeposited Functional Nanowires for Energy Applications
… a combination of Kelvin probe force microscopy (KPFM) and non--destructive piezoresponse force microscopy (ND-PFM). Both nanoscale and bulk ME measurements have been performed on Ni - P(VDF-TrFE) ME composite (1-1) NWs, nanocomposite (1-3) films and (2-2) laminates. The latter two structures have …
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Morphology-Property Relationship for Binary Organic Thin Films
… (AFM) and Kelvin Probe Force Microscope (KPFM). Films of pure DH6T and pure PCBM and their mixture films were systematically analyzed to reveal topography and surface potential of different phases. This study found a vertical packing system of pure DH6T on HOPG surface in island forms. …
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THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE
… microscopy (AFM), Kelvin probe force microscopy (KPFM), and surface photovoltage spectroscopy (SPS) to show that surface treatment and processing plays a significant role in the quality, stability, and efficiency of potential next generation devices. This is evident in our results showing that the …
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Electro-mechanically interfacing with biology using piezoelectric polymer nanostructures
… FEA simulations. Kelvin Probe Force Microscopy (KPFM) highlighted the difference in surface potential between amorphous and crystalline nanotubes. PFM data also demonstrated the piezoelectric activity of both crystalline and amorphous nanotubes. The interaction between PLLA nanotubes and Human …
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PU elastomers and grafted GO/PU nanocomposite with self-healing and self-adapting capabilities for next-generation electrical insulation
… nanoscale Kelvin probe force microscopy (KPFM) and macroscopic thermally stimulated current. The application of this grafted GO/PU nanocomposite exhibited excellent self-adaptive field grading capability at typical triple junction with field distortion. The grafted GO/PU nanocomposites …
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Nanoscale electrical characterisation of nitride structures
… (C-AFM) and kelvin probe force microscopy (KPFM), were utilized to study the structures of nitride devices such as high electron mobility transistors (HEMTs), light emitting diodes (LEDs) and junction diodes. These results combine with other characterisation techniques to give an enhanced …
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Nano-engineering of Atomically Thin Novel 2D Materials and Their Heterostructures
… first time using kelvin probe force microscopy (KPFM). Dynamics of band alignment led to elusive resonance phenomena. Such hybrid heterostructures can be used potentially in solar cells improved efficiency.
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Nano-engineering of Atomically Thin Novel 2D Materials and Their Heterostructures
… first time using kelvin probe force microscopy (KPFM). Dynamics of band alignment led to elusive resonance phenomena. Such hybrid heterostructures can be used potentially in solar cells improved efficiency.
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An investigation into six-fold domain wall vertices in improper ferroelectrics, and their potential as one dimensional pn-junctions
… of surfaces using Kelvin Probe Force Microscopy (KPFM), has been developed and implemented in examining the carrier characteristics of conducting ferroelectric domain walls in the improper ferroelectric system ErMnO3. Preliminary measurements reveal that p-type carriers aggregate at tail-to-tail …
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MoS2 on Gold: achieving extremely high exfoliation yield and optical contrast for Van der Waals monolayers
… (AFM) and Kelvin probe force microscopy (KPFM) measurements were carried out to characterize layer thickness and surface potential of the large coverage of MoS2 on Au substrates. The dominant monolayer coverage of these films is attributed to strain-induced stacking displacements and layer …
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Film sottili di In2O3 drogati con metalli di transizione come TCO per applicazioni nel fotovoltaico
… Modulated Kelvin Probe Force Microscopy (FM-KPFM) e Scanning Electron Microscopy (SEM). Le proprietà elettriche verranno descritte introducendo il concetto di Sheet resistance e determinate con misure Hall. Le proprietà ottiche, con gli spettri di trasmittanza e riflettanza nel range …
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Auflösungsvermögen und Genauigkeit der Kelvinsonden-Rasterkraftmikroskopie und deren Anwendung an molekularen Systemen
Die Arbeit befasst sich mit der Erforschung und Anwendung der Kelvinsonden-Rasterkraftmikroskopie. Die Technik wird bezüglich der Quantität der gemessenen Werte und der erzielbaren lateralen Auflösung untersucht und auf diverse Probensysteme angewandt. Die so erhaltenen nanoskopischen Werte werden …