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In-System Testing of Configurable Logic Blocks in Xilinx 7-Series FPGAs

Modi, Harmish RajeshkumarVirginia Tech2015

… in modern FPGAs that have a large number of logic blocks. This thesis presents an improved BIST architecture for all Xilinx 7-Series FPGAs that is scalable to large arrays. The two primary sources of overhead associated with FPGA BIST, the test time and the memory required for storing the …

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