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Showing 1 to 1 of 1 for “"Integrated circuits--Very large scale integration--Testing."”.
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A truly embedded test structure for design-for-manufacturability, hardware security and VLSI testing
… respectively. The LSSD-based REBEL structure is integrated into a 32-bit pipelined floating point unit (FPU), implemented in IBM's 90nm technology, and the path delay measurements from 62 copies of the chip are used to analyze die-to-die and within-die variations. The MUX- D-based REBEL is …