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Showing 1 to 1 of 1 for “"Integrated circuits--Effect of radiation on"”.
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Probabilistic risk assessment of system-level radiation effects
System-level radiation effects analysis is performed using a time-dependent Probabilistic Risk Assessment (PRA) methodology. Data-driven models for the expected behavior of radiation-sensitive parts are instanced in a system model for Fault Tree Analysis (FTA). The system model is then solved using …