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Showing 1 to 2 of 2 for “"Integrated Circuit Reliability"”.
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Probabilistic simulation for reliability analysis of VLSI circuits
… thesis presents a new technique for simulating integrated circuits, called probabilistic simulation. Using this technique, statistical descriptions of the voltage waveforms at the circuit primary inputs are used to derive corresponding statistical descriptions of the internal voltages and …
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Investigation of factors determining charged device model electrostatic discharge reliability of integrated circuits
Submission published under a 24 month embargo labeled 'U of I Access', the embargo will last until 2027-08-01