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Showing 1 to 1 of 1 for “"In-situ opto-electronic"”.
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In-situ plasmon-enhanced characterization of optically accessible ultra-thin film ferroelectric devices
… characterisation techniques and probes for optoelectronic analysis of ultra-thin film ferroelectric (FE) devices, which overcome the drawbacks of contemporary investigation methods such as their destructive nature, lack of precision, or in certain techniques the requirement for a vacuum …