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Showing 1 to 1 of 1 for “"IMFP"”.
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Concentration depth-profile reconstruction from angle-resolved XPS data using the maximum entropy method: characterization of surface film formed on Ni-18P alloy
… an iterative procedure for calculating the IMFP values taking into account the actual depth-profile of the sample surface under investigation. In a first phase, numerical experiments were performed on a large series of computer generated, ideal and error containing, ARXPS data from model …