Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 4 of 4 for “"IC reliability"”.
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Ic-Rest(2): A Time-to-Market Driven IC Reliability Statistics Tool
… rate equations (in time and space) under static and dynamic operation. The predicted failure statistics are best described by the generalized Gamma-distribution (or more accurately the generalized B-distribution) and on a Gumbel plot look more Weibull than Log-normal .
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Design, Characterization and Analysis of Component Level Electrostatic Discharge (ESD) Protection Solutions
Electrostatic Discharges (ESD) is a significant hazard to electronic components and systems. Based on a specific process technology, a given circuit application requires a customized ESD consideration that meets all the requirements such as the core circuit's operating condition, maximum accepted …
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Charged device model electrostatic discharge protection and test methods for integrated circuits
… the robustness of integrated circuits (ICs) to electrostatic discharge (ESD). Specifically, this work focuses on charged device model (CDM) protection and test methods. In this work it is shown that the CDM robustness of an I/O can be increased by proper biasing of the gates during an …
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Investigation of system-level ESD-induced failures
Electrostatic discharge (ESD) is a phenomenon that can adversely impact the operation of systems. ESD is a short duration, high current stress which can cause the permanent failure of a system or temporary glitches in a system. Soft failures include any recoverable system malfunction, from resets …